SF32LB52x Hardware Design Guide — PCB Layout Checklist¶
Part of the SF32LB52x Hardware Design Guide
This page covers Section 6.15, the item-by-item PCB layout checklist. Return to PCB Layout Guidelines.
6.15. PCB Layout Checklist¶
Unlike the schematic checklist, these layout rules don't vary by power variant, so there is no Applies To column — every check point applies to all SF32LB52x variants.
6.15.1. Package¶
Table 6.15-1: Package Checklist
| No. | Check Point | Category |
|---|---|---|
| 1 | Footprint matches the package SPEC | Required |
6.15.2. Power Supply Routing¶
Table 6.15-2: Power Supply Routing Checklist
| No. | Check Point | Category |
|---|---|---|
| 1 | VBUS supply trace ≥16 mil | Required |
| 2 | VBAT supply trace ≥16 mil | Required |
| 3 | VCC supply trace ≥12 mil | Required |
| 4 | LDO2_OUT supply trace ≥10 mil | Required |
| 5 | LDO3_OUT supply trace ≥8 mil | Required |
| 6 | PMU_BUCK_VSW and PMU_BUCK_VOUT traces ≥10 mil | Required |
| 7 | AVDD_BRF supply trace ≥8 mil | Required |
| 8 | AVDD33_AUD supply trace ≥8 mil | Required |
6.15.3. Power Supply Capacitor and Inductor Placement¶
Table 6.15-3: Power Supply Capacitor and Inductor Placement Checklist
| No. | Check Point | Category |
|---|---|---|
| 1 | VBUS capacitor placed close to the pin | Required |
| 2 | VBAT capacitor placed close to the pin | Optional |
| 3 | VCC capacitor placed close to the pin | Required |
| 4 | LDO2_OUT capacitor placed close to the pin | Optional |
| 5 | LDO3_OUT capacitor placed close to the pin | Optional |
| 6 | VSYS capacitor placed close to the pin | Required |
| 7 | BUCK inductor placed close to the chip | Optional |
| 8 | BUCK decoupling capacitor placed as close as possible to the chip pin | Required |
| 9 | VDD_HPSYS capacitor placed close to the pin | Required |
| 10 | VDD_LPSYS capacitor placed close to the pin | Required |
| 11 | VDD_RET capacitor placed close to the pin | Required |
| 12 | VDD_RTC capacitor placed close to the pin | Required |
| 13 | AVDD_BRF capacitor placed close to the pin | Required |
| 14 | AVDD33_AUD capacitor placed close to the pin | Required |
6.15.4. Clock¶
Table 6.15-4: Clock Checklist
| No. | Check Point | Category |
|---|---|---|
| 1 | Crystal placed close to the chip | Required |
| 2 | GND shielding applied around the crystal | Required |
| 3 | Copper keep-out applied under the crystal (4-layer PTH board: top layer; 6-layer HDI board: top layer and layer 2) | Required |
| 4 | Ground-fill clearance along the crystal traces is greater than 1.5x the trace width | Required |
| 5 | 32 kHz crystal's parallel trace pair spacing is greater than 2x the trace spacing | Required |
6.15.5. Buttons¶
Table 6.15-5: Buttons Checklist
| No. | Check Point | Category |
|---|---|---|
| 1 | Button's ESD protection device placed close to the button | Required |
6.15.6. RF¶
Table 6.15-6: RF Checklist
| No. | Check Point | Category |
|---|---|---|
| 1 | RF trace meets the single-ended 50 Ω characteristic-impedance requirement | Required |
| 2 | RF trace width ≥10 mil | Required |
| 3 | At least 60 mil of ground on each side of the RF trace, with sufficient stitching vias to the main ground | Required |
| 4 | Reserved Pi-type antenna matching network placed close to the chip side | Required |
| 5 | Continuous GND plane beneath the RF signal | Required |
| 6 | No high-speed digital signal traces cross beneath the RF signal | Required |
| 7 | No high-di/dt power traces cross beneath the RF signal | Required |
6.15.7. Audio¶
Table 6.15-7: Audio Checklist
| No. | Check Point | Category |
|---|---|---|
| 1 | ADCP is properly ground-guarded | Required |
| 2 | DACP/DACN follow differential routing with ground guarding | Required |
| 3 | DACP/DACN traces are short enough that parasitic capacitance stays below 10 pF | Required |
| 4 | AVDD_BRF/AVDD33_AUD power routing is ground-guarded and kept away from high-current, strongly interfering signals | Required |
6.15.8. ADC¶
Table 6.15-8: ADC Checklist
| No. | Check Point | Category |
|---|---|---|
| 1 | No high-speed signal runs parallel to the GPADC signal without ground guarding | Required |
6.15.9. Test Points¶
Table 6.15-9: Test Points Checklist
| No. | Check Point | Category |
|---|---|---|
| 1 | Test-point locations are suitable for probing or fixture soldering | Required |
| 2 | Program-download test points (VBAT, GND, PA18/DBG_UART_RXD, PA19/DBG_UART_TXD, LDO2_OUT, PA0, PA1, PA34, etc.) meet the size and location requirements of the test fixture | Required |
6.15.10. Ground¶
Table 6.15-10: Ground Checklist
| No. | Check Point | Category |
|---|---|---|
| 1 | Layers adjacent to the main chip are a complete main-ground plane, with sufficient grounding vias | Required |
| 2 | Exposed pad (EPAD) is connected to the main ground through vias | Required |
| 3 | Area under the chip has enough grounding vias connected to the main ground plane | Required |
| 4 | A ring of grounding vias runs around the board edge | Required |